The AFM “Dimension 3100” from Bruker is used for surface analysis of different samples. The AFM provides a Contact, Tapping and Magnetic mode what makes it possible to measure a huge variety of materials concerning their topography, friction and magnetic properties.
Specifications:
- Z movement gauge head: 8 µm
- X-Y movement gauge head: 100 µm x 100 µm
- X-Y „Closed Loop“ control
- Maximum sample size: ca. 2cm
Responible Employees:
Department of Materials Science and Engineering
Prof. Dr. rer. nat. Mathias Göken
Head of Institute, Group Leader Nanomechanics
Chair of General Materials Properties