Scanning electron microscope with FIB- FEI Helios NanoLab 600i DualBeam

Helios NanoLab 600i FIB Workstation with SE-,BSE-,STEM-, EBSD- und EDS-detector: many institutes from FAU are working together on this high-resolution Scanning Electron Microscope with field emission and FIB technology to achieve findings on new concept for lightweight materials and manufacturing processes, i.e. additive manufacturing. The aim is to work interdisciplinary on innovative concepts for engineering materials to obtain better knowledge about the relation of microstructure and bulk properties. For this purpose 3D-analysis of microstructures, innovative in-situ experiments and preparation of electron-transparent samples are realized.

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