Nanoindenter XP (Agilent) is used for instrumental hardness measurements and scratch tests. It is possible to examine hardness and modulus continuously during loading and so take depth profiles.
Installed options:
- Continuous Stiffness Modul (CSM)
- Lateral Force Sensor
- High Load cell
- Optical microscope
- Testworks 4 software
Specifications:
- Maximum load 500 mN (or 10 N with high load cell)
- Resolution depth <0.01 nm
- Resolution load 50 nN
Responsible employees:
Department of Materials Science and Engineering
Matthias Glosemeyer, M. Sc.
Chair of General Materials Properties
Dr. mont. Michael Wurmshuber
Group Leader Nanomechanics
Department of Materials Science and Engineering
Chair of General Materials Properties
- Phone number: +49 9131 85-27473
- Email: michael.wurmshuber@fau.de