Hysitron Triboscope

AFM nanoindenter to research local mechanical properties

 

The device consists of the combination of a Hysitron Triboscope nanoindentation measuring head and a Brucker Multimode AFM-Stage. It enables nanometer-accurate positioning. The surface of a sample is first mapped in AFM mode, then a point can be defined for indentation. An post-indentation image with the AFM allows a direct image of the indent.

 

Specifications

 

–  max force 10 mN

–  Force resolution 1 nN

–  Displacement resolution 0.0004 nm

 

Responsible employees:

Dr. mont. Michael Wurmshuber

Group Leader Nanomechanics

Department of Materials Science and Engineering
Chair of General Materials Properties