AFM nanoindenter to research local mechanical properties
The device consists of the combination of a Hysitron Triboscope nanoindentation measuring head and a Brucker Multimode AFM-Stage. It enables nanometer-accurate positioning. The surface of a sample is first mapped in AFM mode, then a point can be defined for indentation. An post-indentation image with the AFM allows a direct image of the indent.
Specifications
– max force 10 mN
– Force resolution 1 nN
– Displacement resolution 0.0004 nm
Responsible employees:
Dr. mont. Michael Wurmshuber
Group Leader Nanomechanics
Department of Materials Science and Engineering
Chair of General Materials Properties
- Phone number: +49 9131 85-27473
- Email: michael.wurmshuber@fau.de